By Topic

A model of spin wave resonance in grain-surface-layers for effective linewidth and channels of energy transfer on polycrystals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Zhiquan Han ; Southwest Inst. of Appl. Magnetics of China, Sichuan, China

The spin wave dispersion relation for the grain-surface-layer region is calculated by assuming that the anisotropy constant Ks and the anisotropy field Hs in the gain-surface-layer region are different from the other region. In comparison with the manifold of the grain-interior, the resonance region, for the grain-surface-layer region is much broader than that for the grain-interior. The high field and the low field effective linewidths are given respectively: ΔHeff=2χ+s"Vsf(H)(Hi-ω/γ-S)2/Ms and ΔHeff=2[χ+s"Vsf(H)+χ+b"(1-Vs)](Hi-ω/γ-S)2/Ms, by setting χ+i= χ+b(1-Vs)+χ+sVs, where χ+i is the intrinsic susceptibility, χ+b, Vb=1-Vs, χ+s and Vs denote the susceptibility and the volume fraction respectively for the grain-interior and the grain-surface-layer region. The dependence of ΔHeff on the grain size, porosity, temperature, Ms and H, as well as the field shift S vs. H are explained with this model. The value of Ks≈-2×105 erg/cm3 is estimated by fitting data for YIG and NiZn ferrite. An additional basic channel of energy transfer from the rf field via spin wave system of the grain-surface-layer region to the lattice is suggested for polycrystals.

Published in:

Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Date of Conference:

17-19 Aug. 2002