IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Microwave and Millimeter Wave ... Help

Microstrip antenna analysis using fast FDTD methods: a comparison of Prony and ARMA techniques

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Fan Yang ; Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA ; Rahmat-Samii, Y.

Fast FDTD methods are utilized to analyze microstrip antennas in this paper. The procedures of Prony method and the auto-regressive moving-average (ARMA) estimator are briefly outlined and their results are compared to direct FDTD simulation results. Significant improvement on computational efficiency has been observed. It is also noticed that the ARMA estimator can achieve improved results with a lower estimation order than the Prony method.

Published in:
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Date of Conference: 17-19 Aug. 2002

Page(s):
661 - 664
Print ISBN:
0-7803-7486-X
INSPEC Accession Number:
7508411
Digital Object Identifier :
10.1109/ICMMT.2002.1187787
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.