Close category search window
 

Variable-rate pipelined multiplier design for reconfigurable DSP applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sangjin Hong ; Dept. of Electr. & Comput. Eng., State Univ. of New York, Stony Brook, NY, USA ; Shu-Shin Chin ; Connaway, C.

This paper presents a VLSI design and implementation of a variable-rate multiply-and-accumulate (MAC) block for DSP applications. The pipeline depth of the multiplier is dynamically controlled given the throughput requirement of the application. The depth of pipeline varies at the hardware level which controls the rate of execution to save power consumption. The MAC is targeted for a coarse grain FPGA design to support a wide range of digital signal processing applications. The power consumption is lowered by reducing the unnecessary register switching. The technique is applied to carry-save and Booth recoded multipliers. The MAC circuit is designed in 0.35-μm CMOS processing technology and evaluated for current DSP applications.

Published in:
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on  (Volume:1 )

Date of Conference: 4-7 Aug. 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.