Cart (Loading....) | Create Account
Close category search window
 

A test statistic in the complex Wishart distribution and its application to change detection in polarimetric SAR data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Conradsen, K. ; Informatics & Math. Modelling, Tech. Univ. of Denmark, Lyngby, Denmark ; Nielsen, A.A. ; Schou, J. ; Skriver, H.

When working with multilook fully polarimetric synthetic aperture radar (SAR) data, an appropriate way of representing the backscattered signal consists of the so-called covariance matrix. For each pixel, this is a 3×3 Hermitian positive definite matrix that follows a complex Wishart distribution. Based on this distribution, a test statistic for equality of two such matrices and an associated asymptotic probability for obtaining a smaller value of the test statistic are derived and applied successfully to change detection in polarimetric SAR data. In a case study, EMISAR L-band data from April 17, 1998 and May 20, 1998 covering agricultural fields near Foulum, Denmark are used. Multilook full covariance matrix data, azimuthal symmetric data, covariance matrix diagonal-only data, and horizontal-horizontal (HH), vertical-vertical (VV), or horizontal-vertical (HV) data alone can be used. If applied to HH, VV, or HV data alone, the derived test statistic reduces to the well-known gamma likelihood-ratio test statistic. The derived test statistic and the associated significance value can be applied as a line or edge detector in fully polarimetric SAR data also.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:41 ,  Issue: 1 )

Date of Publication:

Jan 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.