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Exclusive test and its applications to fault diagnosis

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4 Author(s)
Agrawal, V.D. ; Agere Syst., Berkeley Heights, NJ, USA ; Dong Hyun Baik ; Yong Chang Kim ; Saluja, K.K.

We introduce a new type of test, called exclusive test, and discuss its application to fault diagnosis in combinational circuits. A test that detects exactly one fault from a given pair of faults is called an exclusive test. In general, generation of an exclusive test by a conventional automatic test generator requires a model of the circuit with multiple-faults. We describe an ATPG model that transforms the exclusive test problem into a single-fault test generation problem. We present a generalized diagnostic method and illustrate the use of exclusive tests in improving the diagnostic resolution of a test set. Results of diagnosis with exclusive tests for ISCAS85 benchmark circuits are included.

Published in:

VLSI Design, 2003. Proceedings. 16th International Conference on

Date of Conference:

4-8 Jan. 2003