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A path sensitization technique for testing of switched capacitor circuits

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2 Author(s)
Biswas, S. ; Center for Silicon Syst. Integration, Carnegie Mellon Univ., Pittsburgh, PA, USA ; Mazhari, B.

In this work, we describe a new method for testing of switched capacitor (SC) circuits, based on modeling the circuit as a charge transfer graph. Based on the differences between the graphs of good and faulty circuits, one or more paths are identified such that upon their sensitization the difference in output voltage of the good and faulty circuits becomes appreciable. The validity of the proposed technique is demonstrated using the examples of SC lossy integrator, voltage amplifier and biquad filter circuits. It is shown that the proposed technique is efficient in testing both catastrophic as well as parametric faults in the capacitors.

Published in:

VLSI Design, 2003. Proceedings. 16th International Conference on

Date of Conference:

4-8 Jan. 2003