Referenced Items are not available for this document.
The performance of fiber optic and planar waveguide interferometric devices can be degraded by path length errors. These imbalances can occur during device fabrication, during the inscription of gratings into these devices, or during device stabilization. Correction of these errors by ultraviolet exposure is typically performed prior to annealing and is thus not stable. We present a post-annealing process to correct for fabrication errors and create stable devices. Results obtained for a fiber Mach-Zehnder add-drop are presented.
Published in:
Photonics Technology Letters, IEEE
(Volume:15
,
Issue:
3
)
Date of Publication: March 2003
- Page(s):
- 419 - 421
- ISSN :
- 1041-1135
- INSPEC Accession Number:
- 7545945
- Digital Object Identifier :
- 10.1109/LPT.2002.807941
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 28 February 2003
- Issue Date :
- March 2003
- Sponsored by :
- IEEE Photonics Society
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