Cart (Loading....) | Create Account
Close category search window

Color image segmentation with detection of highlights and local illumination induced by inter-reflections

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bajcsy, R. ; Dept. of Comput. & Inf. Sci., Pennsylvania Univ., Philadelphia, PA, USA ; Lee, S.W. ; Leonardis, A.

A computational model for color image segmentation is proposed based on the physical properties of sensors, illumination lights, and surface reflectances. For image segmentation to depend only on the change of material surface, variations of surface reflection due to illumination, shading, shadows, and highlights should be discounted from a measured image. The authors use the dichromatic model for dielectric materials and develop a metric space of intensity, hue, and saturation in order to interpret various light-surface interactions better. Using the established model for surface reflection, the authors perform color image segmentation based on the material change with detection of highlights and small interreflections between adjacent objects. A reference plate is used to whiten global illumination. The detected interreflections represent local variation of illumination

Published in:

Pattern Recognition, 1990. Proceedings., 10th International Conference on  (Volume:i )

Date of Conference:

16-21 Jun 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.