By Topic

Power supply transient signal analysis for defect-oriented test

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Plusquellic, J. ; Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD, USA ; Singh, A. ; Patel, C. ; Gattiker, A.

Transient signal analysis (TSA) is a testing method that is based on the analysis of a set of VDD transient waveforms measured simultaneously at each supply port. Defect detection is performed by applying linear regression analysis to the time or frequency domain representations of these signals. Chip-wide process variation effects introduce signal variations that are correlated across the individual power port measurements. In contrast, defects introduce uncorrelated local variations across these measurements that can be detected as anomalies in the cross-correlation profile derived (using regression analysis) from the power port measurements of defect-free chips. This paper focuses on the application of TSA to the detection of delay faults.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:22 ,  Issue: 3 )