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Effects of amplitude modulation in jitter tolerance measurements of communication devices

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4 Author(s)
Ishida, M. ; Advantest Labs., Ltd., Miyagi, Japan ; Yamaguchi, T.J. ; Soma, M. ; Musha, H.

This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.

Published in:

Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian

Date of Conference:

18-20 Nov. 2002