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Exact computation of maximally dominating faults and its application to n-detection tests

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3 Author(s)
Polian, I. ; Albert-Ludwigs-Univ., Freiburg, Germany ; Pomeranz, I. ; Becker, B.

n-detection test sets for stuck-at faults have been shown to be useful in detecting unmodeled defects. It was also shown that a set of faults, called maximally dominating faults, can play an important role in controlling the increase in the size of an n-detection test set as n is increased. In an earlier work, a superset of the maximally dominating fault set was used. In this work, we propose a method to determine exact sets of maximally dominating faults. We also define a new type of n-detection test sets based on the exact set of maximally dominating faults. We present experimental results to demonstrate the usefulness of this exact set in producing high-quality n-detection test sets.

Published in:

Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian

Date of Conference:

18-20 Nov. 2002