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A new method for analyzing s-t reliability of communication networks

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3 Author(s)
Zu Yunxiao ; Dept. of Electr. Eng., Tsinghua Univ., Beijing, China ; Sun Yugeng, ; Wang Zanji

A new method, state transition(ST), for analyzing s-t reliability of communication networks is developed . ST is based on the finding that the message transmission process can be described by the Markov chain with two absorbing states. With ST all the non-absorbing states can be generated with depth-first search or breadth-first search and the network reliability can be computed with a back reiteration technique after computing the one-step transition probability between states.

Published in:

TENCON '02. Proceedings. 2002 IEEE Region 10 Conference on Computers, Communications, Control and Power Engineering  (Volume:2 )

Date of Conference:

28-31 Oct. 2002