Cart (Loading....) | Create Account
Close category search window

Electron temperature and plasma density in surface-discharged alternating-current plasma display panels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

11 Author(s)
Eun Ha Choi ; Dept. of Electrophys., Kwangwoon Univ., Seoul, South Korea ; Jeong Chull Ahn ; Min Wook Moon ; Jin Goo Kim
more authors

The electron temperature and plasma density at the lateral distance of 125 μm from the center of sustaining electrode gap have been investigated by a Langmuir probe along with the high-speed discharge image in coplanar alternating current plasma display panels. The plasma density at the lateral distance of 125 μm from the center of sustaining electrode gap is shown to be maximum value of 3.7×1011 cm-3, whereas the electron temperature is measured to be decreased from 1.8 to 0.8 eV as the gas pressure increases from 150 to 400 torr in this experiment. It is noted that the electron temperatures measured by the Langmuir probe and high-speed image camera are in good agreement with each other within 5% error limit.

Published in:

Plasma Science, IEEE Transactions on  (Volume:30 ,  Issue: 6 )

Date of Publication:

Dec 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.