Cart (Loading....) | Create Account
Close category search window
 

Single-shot, repetitive, and lifetime high-voltage testing of capacitors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Shkuratov, S.I. ; Dept. of Electr. & Comput. Eng. & Phys., Texas Tech Univ., Lubbock, TX, USA ; Talantsev, E.F. ; Hatfield, L.L. ; Dickens, J.C.
more authors

Four different types of capacitors have been tested to determine the maximum usable high voltage. Ceramic, drop-dipped film, molded-mylar tubulars, and polyester/foil capacitors of different values and different nominal voltages were tested in four modes: the single-shot mode, the repetitive mode, the lifetime dc voltage mode, and the group mode. Experiments have shown that the breakdown voltage for all types of the capacitors tested is ten to seventeen times higher than the nominal voltage. The energy stored in the capacitors for a short time under overstress conditions is from 100 to 250 times higher their normal energy. Data are given for the limitations for single capacitors, and for two, three, and four capacitors connected in parallel.

Published in:

Plasma Science, IEEE Transactions on  (Volume:30 ,  Issue: 5 )

Date of Publication:

Oct 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.