By Topic

Circular BIST with state skipping

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Touba, N.A. ; Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA

Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion. However, it has seen limited use because it does not reliably provide high fault coverage. This paper presents a systematic approach for achieving high fault coverage with circular BIST. The basic idea is to add a small amount of logic that causes the circular chain to skip to particular states. This "state skipping" logic can be used to break out of limit cycles, break correlations in the test patterns, and jump to states that detect random-pattern-resistant faults. The state skipping logic is added in the chain interconnect and not in the functional logic, so no delay is added on system paths. Results indicate that in many cases, this approach can boost the fault coverage of circular BIST to match that of conventional parallel BIST approaches while still maintaining a significant advantage in terms of hardware overhead and control complexity. Results are also shown for combining "state skipping" logic with observation point insertion to further reduce hardware overhead.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:10 ,  Issue: 5 )