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Effect of random errors in planar near-field measurement

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2 Author(s)
A. C. Newell ; NBS, Boulder, CO, USA ; C. F. Stubenrauch

Expressions that relate the signal-to-noise ratio in the near field to the signal-to-noise ratio in the far field are developed. The expressions are then used to predict errors in far-field patterns obtained from near-field data. A technique for measuring the noise in the calculated far-field pattern by calculating the spectrum in the evanescent region from a single-dimensional oversampled scan is also described

Published in:

IEEE Transactions on Antennas and Propagation  (Volume:36 ,  Issue: 6 )