Cart (Loading....) | Create Account
Close category search window

Approaches to evaluate the virtual instrumentation measurement uncertainties

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nuccio, S. ; Dipt. di Igegneria Elettrica, Univ. di Palermo, Italy ; Spataro, C.

This paper deals with the metrological characterization of virtual instruments. After a brief description of the features, the components and the working principle of the virtual instruments and the various uncertainty sources are analyzed. Then, two methods to evaluate the uncertainty of the measurement results are presented: a numerical method simulating the physical process of the A/D conversion, and an approximated theoretical method applying the "uncertainty propagation law" of the "guide to the expression of uncertainty in measurement." With both methods, the combined standard uncertainty of the measurement result is obtained, starting from the standard uncertainty generated by each single source. The results obtained by means of the theoretical analysis are compared with the ones obtained from numerical simulation and with the ones obtained by means of experimental tests.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:51 ,  Issue: 6 )

Date of Publication:

Dec 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.