Cart (Loading....) | Create Account
Close category search window
 

Leaking capacitors muck up motherboards

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

Aluminum electrolytic capacitors with a low equivalent series resistance (ESR) are high-capacitance components that generally serve to smooth out the power supply to chips. Throughout 2002, they have been breaking open and failing in certain desktop PCs. So far, the only motherboard maker to admit to the problem is ABIT Computer Corp. (Taipei), and the only major PC maker to acknowledge being affected is IBM Corp. But the problem is likely to be more widespread. It is clear now that a faulty electrolyte is to blame for the burst capacitors. Apparently, a scientist stole the formula for an electrolyte from his employer in Japan and began using it himself at the Chinese branch of a Taiwanese electrolyte manufacturer. He or his colleagues then sold the formula to an electrolyte maker in Taiwan, which began producing it for Taiwanese and possibly other capacitor firms. Unfortunately, the formula as sold was incomplete.

Published in:

Spectrum, IEEE  (Volume:40 ,  Issue: 2 )

Date of Publication:

Feb. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.