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The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

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1 Author(s)
Baumann, R. ; Silicon Technol. Dev. Group, Texas Instrum. Inc., Dallas, TX, USA

The soft error rate (SER) of advanced CMOS devices is higher than all other reliability mechanisms combined. Memories can be protected with error correction circuitry but SER in logic may limit future product reliability. Memory and logic scaling trends are discussed along with a method for determining logic SER.

Published in:

Electron Devices Meeting, 2002. IEDM '02. International

Date of Conference:

8-11 Dec. 2002