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SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms

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4 Author(s)
Alippi, C. ; Dipt. di Elettronica e Informazione, Politecnico di Milano, Italy ; Catelani, M. ; Fort, A. ; Mugnaini, M.

This paper addresses the fault diagnosis issue based on a simulation before test philosophy in analog electronic circuits. Diagnosis, obtained by comparing signatures measured at the test nodes with those contained in a fault dictionary, allows for sub-systems testing and fault isolation within the circuit. A novel method for constructing the fault dictionary under the single faulty component/unit hypothesis is proposed. The method, based on a harmonic analysis, allows for selecting the most suitable test input stimuli and nodes by means of a global sensitivity approach efficiently carried out by randomized algorithms. Applicability of the method to a wide class of circuits and its integration in diagnosis tools are granted since randomized algorithms assure that the selection problem can be effectively carried out with a poly-time algorithm independently from the fault space, structure, and complexity of the circuit.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:51 ,  Issue: 5 )

Date of Publication:

Oct 2002

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