By Topic

Identifying transformer incipient events for maintaining distribution system reliability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Butler-Purry, K.L. ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; Bagriyanik, M.

This paper presents the time domain and time-frequency domain analysis results of incipient events in single-phase distribution transformers. This analysis aids in the development of an automatic detection method for internal incipient faults in the transformers. The detection method can provide information to predict failures ahead of time so that the necessary corrective actions are taken to prevent outages and reduce down times. The analyzed data was obtained from simulations and experiments. Time-frequency analysis was performed using discrete wavelet transform (DWT). The obtained results are discussed.

Published in:

System Sciences, 2003. Proceedings of the 36th Annual Hawaii International Conference on

Date of Conference:

6-9 Jan. 2003