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An all-digital DFT scheme for testing catastrophic faults in PLLs

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5 Author(s)
Azais, F. ; LIRMM, Univ. of Montpellier, France ; Bertrand, Y. ; Renovell, M. ; Ivanov, A.
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Traditional functional testing of mixed-signal ICs is slow and requires costly, dedicated test equipment. The authors update the standard PLL architecture to allow simple digital testing. The all-digital strategy yields catastrophic fault coverage as high as that of the classical functional test, plus it is fast, extremely simple to implement, and requires only standard digital test equipment.

Published in:

Design & Test of Computers, IEEE  (Volume:20 ,  Issue: 1 )