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2D test sequence generators

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3 Author(s)
Mrugalski, G. ; Poznan Univ. of Technol., Poland ; Tyszer, J. ; Rajski, J.

In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and balances the use of generator stages.

Published in:

Design & Test of Computers, IEEE  (Volume:20 ,  Issue: 1 )