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Multidimensional imaging of three dimensional (3-D) objects is often complicated by physical constraints imposed by the observation technique. An example of this problem occurs in 3-D imaging of specimens with electron-microscopes. In this case the range of observation angle (perspective) is typically less than π/2 radians due to the limited angle through which the specimen can be rotated relative to the electron beam. This paper presents three novel algorithms that significantly enhance the resolution of techniques limited by lack of perspective. The methods are based on a combination of Gerchberg's spectral error energy reduction algorithm (1) and tomographic image reconstruction techniques.