Cart (Loading....) | Create Account
Close category search window
 

Processing techniques for the inspection of offshore structures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Durrani, T.S. ; University of Strathclyde, Glasgow, U.K. ; MacLeod, C. ; Pearson, J. ; Hayward, G.

This paper is concerned with the techniques required for the acquisition and processing of signals arising in ultrasonic non-destructive testing of steel structures in the underwater environment. The primary aim is to minimize diver participation in the inspection and interpretation of results. The resulting systems, which involve significant use of microprocessor hardware were designed to operate with equal facility with either single or multiple ultrasonic channels, the latter being important with the ancillary requirements of beam steering and beam shaping. The paper describes two approaches to the detection and location of faults, one concerned with the use of large ultrasonic crystals has led to the development of the Strathclyde SHOE, the other employs ultrasonic arrays for area scanning via beam steering. An analysis is included for signal returns on the arrays for estimating the location of a reflection point which leads to enhanced range resolution.

Published in:

Acoustics, Speech, and Signal Processing, IEEE International Conference on ICASSP '81.  (Volume:6 )

Date of Conference:

Apr 1981

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.