Cart (Loading....) | Create Account
Close category search window

Design and evaluation of double-transform pitch determination algorithms with nonlinear distortion in the frequency domain-preliminary results

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Indefrey, H. ; Technische Universität München, Munich, W.Germany ; Hess, W. ; Seeser, G.

The performance of double-transform pitch determination algorithms (PDAs) with frequency-domain nonlinear distortion is investigated. This PDA principle comprises well-known PDAs, such as the autocorrelation PDA and the cepstrum PDA. Besides these two, the amplitude spectrum and the fourth-root spectrum PDAs were implemented and tested under various environmental conditions (clean signal, telephone-quality signal, and signal degraded by additive Gaussian noise). First results suggest that the fourth-root spectrum and the amplitude spectrum PDAs are less sensitive to noise than the cepstrum PDA and less sensitive to strong first formants than the autocorrelation PDA.

Published in:

Acoustics, Speech, and Signal Processing, IEEE International Conference on ICASSP '85.  (Volume:10 )

Date of Conference:

Apr 1985

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.