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We present a novel approach to optimization-based variation-tolerant analog circuit sizing. Using formal methods based on affine arithmetic, we calculate guaranteed bounds on the worst-case behavior and deterministically find the global optimum of the sizing problem by means of branch-and-bound optimization. To solve the nonlinear circuit equations with parameter variations, we define a novel affine-arithmetic Newton operator that gives a significant improvement in computational efficiency over an implementation using interval arithmetic. The calculation of guaranteed worst-case bounds and the global optimization are demonstrated by a prototype implementation.