Cart (Loading....) | Create Account
Close category search window
 

Theoretical and practical validation of combined BEM/FEM substrate resistance modeling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Schrik, E. ; DIMES, Delft Univ. of Technol., Netherlands ; Dewilde, P.M. ; van der Meijs, N.P.

In mixed-signal designs, substrate noise originating from the digital part can seriously influence the functionality of the analog part. As such, accurately modeling the properties of the substrate as a noise-propagator is becoming ever more important. A model can be obtained through the finite element method (FEM) or the boundary element method (BEM). The FEM performs a full 3D discretization of the substrate, which makes this method very accurate and flexible but also slow. The BEM only discretizes the contact areas on the boundary of the substrate, which makes it less flexible, but significantly faster. A combination between BEM and FEM can be efficient when we need flexibility and speed at the same time. This paper briefly describes the BEM and the FEM and their combination, but mainly concentrates on the theoretical validation of the combined method and the experimental verification through implementation in the SPACE layout to circuit extractor and comparison with commercial BEM and FEM tools.

Published in:

Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on

Date of Conference:

10-14 Nov. 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.