Cart (Loading....) | Create Account
Close category search window

Integrated access to function test results from within a cardiology information system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
van der Velde, E.T. ; Dept. of Cardiology, Leiden Univ. Med. Center, Netherlands ; Hoekstra, W.H.G.J. ; Witteman, T.A. ; Brobbel, C.
more authors

A dedicated cardiology information system (CARIS) has been developed in our department to record all information pertaining to studies performed in the cathlab and pacemaker lab. However, information stored in other systems in the cardiac function lab was not available in CARIS. This includes ECGs (rest ECGs, stress ECGs and Holter ECGs), and reports from echo studies and stress ECG studies. Data obtained from these functional studies are stored in various database systems. For each of these systems a different, dedicated interface was developed to allow the cardiologist to obtain access to the data from within CARIS. These results show that integration of all information available in the cardiology department is feasible. Presently, we are developing a completely new version of CARIS that will allow optimal integration of cardiology based information (as well as in the CARIS database, as in separate systems) with data in the hospital information system.

Published in:

Computers in Cardiology, 2002

Date of Conference:

22-25 Sept. 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.