Cart (Loading....) | Create Account
Close category search window

Topographic SAR interferometry formulation for high-precision DEM generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Abdelfattah, R. ; Lab. de Teledetection et Syst me d''Inf., Ecole Nationale d''Ingenieurs de Tunis, Tunisia ; Nicolas, J.M.

In repeat-pass synthetic aperture radar (SAR) interferometry, the approximations, allowing the phase-to-height conversion, prevent high-resolution mapped relief. In this paper, we present a more general and exact formulation giving a new relationship between the interferogram phase and the target height. It is based on the interferometric SAR geometry and on a better expansion of the path length difference between the sensor and the target. This formulation emphasizes the impact of baseline uncertainties on digital elevation model (DEM) accuracy. A quantitative assessment of the required baseline accuracy is computed. The impact of orbital parameters, used in the new formulation, on interferogram generation is studied. Thus, a new simulator algorithm is developed and tested on a set of reference and simulated DEM examples. Examples of interferogram simulation and DEM generation validate this new approach in the case of a mountainous area in Mustang (Nepal).

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:40 ,  Issue: 11 )

Date of Publication:

Nov 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.