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Some issues of the critical ratio dispatch rule in semiconductor manufacturing

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1 Author(s)
Rose, O. ; Inst. of Comput. Sci., Wurzburg Univ., Germany

In this paper, we examine the cycle time and on-time delivery performance of a semiconductor wafer fabrication facility (wafer fab) under critical ratio (CR) dispatch regime. It turns out that determining appropriate due dates for this rule is a critical task. We provide a detailed analysis of the wafer fab behavior for a large range of due date values. From the results of the experiments we develop an heuristic for conservative due date estimates.

Published in:
Simulation Conference, 2002. Proceedings of the Winter  (Volume:2 )

Date of Conference: 8-11 Dec. 2002

Page(s):
1401 - 1405 vol.2
Print ISBN:
0-7803-7614-5
INSPEC Accession Number:
7644384
Digital Object Identifier :
10.1109/WSC.2002.1166410
Product Type:
Conference Publications

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