Skip to Main Content
In this paper, we examine the cycle time and on-time delivery performance of a semiconductor wafer fabrication facility (wafer fab) under critical ratio (CR) dispatch regime. It turns out that determining appropriate due dates for this rule is a critical task. We provide a detailed analysis of the wafer fab behavior for a large range of due date values. From the results of the experiments we develop an heuristic for conservative due date estimates.
Simulation Conference, 2002. Proceedings of the Winter (Volume:2 )
Date of Conference: 8-11 Dec. 2002