Cart (Loading....) | Create Account
Close category search window

Logical convolution and discrete Walsh and Fourier power spectra

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Robinson, G. ; COMSAT Laboratories, Clarksburg, MD

The Walsh power spectrum of a sequence of random samples is defined as the Walsh transform of the logical autocorrelation function of the random sequence. The "logical" autocorrelation function is defined in a similar form as the "arithmetic" autocorrelation function. The Fourier power spectrum, which is defined as the Fourier transform of the arithmetic autocorrelation function, can be obtained from the Walsh power spectrum by a linear transformation. The recursive relations between the logical and arithmetic auto-correlation functions are derived in this paper. For a given process with computed or modeled autocorrelation function the Fourier and Walsh power spectra are computed by using the fast Fourier and Walsh transforms, respectively. Examples are given from the speech and imagery data.

Published in:

Audio and Electroacoustics, IEEE Transactions on  (Volume:20 ,  Issue: 4 )

Date of Publication:

Oct 1972

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.