By Topic

Investigation of MW characteristics of HTS microstrip and coplanar resonators with ferrite thin-film components

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Nurgaliev, T. ; Inst. of Electron. BAS, Sofia, Bulgaria ; Miteva, S. ; Jenkins, A.P. ; Dew-Hughes, D.

Formulas for calculating the magnetic-field dependence of the resonance frequency and the quality factor of HTS microstrip (MS) and coplanar-waveguide resonators with a tangentially magnetized ferrite film component were obtained within the framework of the perturbation method. The conditions of attaining the maximum magnetic tuning effect of the resonance frequency (with reference to the external magnetic-field strength, the field-orientation angle, and the ferrite film position in the resonator) were determined and verified in the example of model resonators, formed from copper MS and ground-plane electrodes, a yttrium-iron-garnet (YIG) ferrite film component, and dielectric spacers. A YBCO MS resonator with a YIG component was also prepared and its characteristics were measured at 77 K.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:51 ,  Issue: 1 )