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Simple noise deembedding technique for on-wafer shield-based test fixtures

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2 Author(s)
Kolding, T.E. ; Nokia Networks, Aalborg, Denmark ; Iversen, Christian Rye

Conventional on-wafer test fixtures have a significant impact on two-port noise-parameter measurements of silicon devices at gigahertz frequencies. This leads to increased measuring inaccuracy, as well as a need for complicated and area-consuming deembedding procedures. Alternatively, shield-based test fixtures are characterized by very few series effects and, thus, support cost-efficient and simple deembedding. The applicability of a simple one-step method is illustrated with experimental data. A performance comparison is made to full-scale deembedding methods based on conventional, as well as shield-based test fixtures.

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:51 ,  Issue: 1 )