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An all-digital analog-to-digital converter with 12-μV/LSB using moving-average filtering

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3 Author(s)
Watanabe, T. ; Res. & Dev. Dept., DENSO Corp., Aichi, Japan ; Mizuno, T. ; Makino, Y.

A compact, high-resolution analog-to-digital converter (ADC) especially for sensors is presented. The basic structure is a completely digital circuit including a ring-delay-line with delay units (DUs), along with a frequency counter, latch, and encoder. The operating principles are: (1) the delay time of the DU is modulated by the analog-to-digital (A/D) conversion voltage and (2) the delay pulse passes through a number of DUs within a sampling (= integration) time and the number of DUs through which the delay pulse passes is output as conversion data. Compact size and high resolution were realized with an ADC having a circuit area of 0.45 mm2 (0.8-μm CMOS) and a resolution of 12 μV (10 kS/s). Its nonlinearity is ±0.1% FS per 200-mV span (1.8-2.0 V), for 14-b resolution. Sample holds are unnecessary and a low-pass filter function removes high-frequency noise simultaneously with A/D conversion. Thus, the combination of this ADC and a digital filter that follows can eliminate an analog prefilter to prevent the aliasing before A/D conversion. Also, both this ADC can be shrunk and operated at low voltages, so it is an ideal means to lower the cost and power consumption. Drift errors can be easily compensated for by digital processing.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:38 ,  Issue: 1 )

Date of Publication:

Jan 2003

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