By Topic

Cathode effects on a relativistic magnetron driven by a microsecond e-beam accelerator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

16 Author(s)
M. R. Lopez ; Intense Energy Beam Interaction Lab., Michigan Univ., Ann Arbor, MI, USA ; R. M. Gilgenbach ; D. W. Jordan ; S. A. Anderson
more authors

Experiments have been performed on a relativistic magnetron driven at e-beam accelerator peak parameters: voltage = -0.4 MV, current = 16 kA, and pulselength = 0.5 μs. The magnetron is a six-vane device operating at about 1 GHz with extraction from two cavities. For equal power in both extraction waveguides, the peak microwave power of this device is between 200 and 300 MW. Microwave pulse-shortening limits pulselengths to the range of 10-100 ns. Time-frequency analysis of microwave emission indicates operation at about 1.03 GHz, close to the pi mode frequency identified from cold tests and the three-dimensional MAGIC code. Two cold cathodes were tested: 1) an emitting aluminum knob in the vane region with no endcap and 2) an extended cathode with a graphite fiber emission region in the vanes and endcap outside the vanes. Electron endloss current has been measured for the two cathodes. With no endcap, the cathode exhibited endloss current fraction up to 50% of the total; with one endcap, the cathode reduced the endloss current fraction to as little as 12%. Both cathodes produced peak total-electronic efficiency in the range of 14%-21%.

Published in:

IEEE Transactions on Plasma Science  (Volume:30 ,  Issue: 3 )