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Memory effects in argon, nitrogen, and hydrogen

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2 Author(s)
Pejovic, M.M. ; Fac. of Electron. Eng., Nis Univ., Serbia ; Ristic, G.S.

The contributions of the positive ions and neutral active states, remaining from previous discharge, as well as the contribution of gamma photons from 2760Co radiation source to the electrical breakdown in argon, nitrogen, and hydrogen at 6.6-mbar pressure for the various afterglow periods have been analyzed using the time delay method. The estimations of the positive ion recombination times of argon, nitrogen, and hydrogen, and the lifetime of argon metastable state, as well as the atom recombination times of nitrogen and hydrogen have been performed using this method.

Published in:

Plasma Science, IEEE Transactions on  (Volume:30 ,  Issue: 3 )

Date of Publication:

Jun 2002

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