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Session 13 charge-coupled devices and applications [breaker page]

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1 Author(s)
Terman, L. ; IBM T.J. Watson Research Center, Yorktown Heights, NY, USA

Start of the above-titled section of the conference proceedings record.

Published in:

Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International  (Volume:XVII )

Date of Conference:

15-13 Feb. 1974