By Topic

Picosecond optical sampling of GaAs integrated circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Weingarten, K.J. ; Edward L. Ginzton Lab., Stanford Univ., CA, USA ; Rodwel, M.J.W. ; Bloom, D.M.

Direct electrooptic sampling is a noncontact optical-probing technique for measuring with picosecond time resolution the voltage waveforms at internal nodes within GaAs integrated circuits. The factors contributing to system bandwidth, sensitivity, spatial resolution, and circuit perturbation are discussed, as are the circuit requirements for realistic testing of analog and digital devices. Measurements of high-speed GaAs integrated circuits are presented, including time-domain waveform and timing measurements of digital and analog circuits and frequency-domain transfer function measurements of microwave circuits and transmission structures.<>

Published in:

Quantum Electronics, IEEE Journal of  (Volume:24 ,  Issue: 2 )