By Topic

Performance degradation in fast frequency-scanned circular arrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Arora, R. ; Indian Institute of Technology, New Delhi, India ; Patel, M.

The performance deterioration that sets is when a circular array is scanned fast using the method of frequency scanning is considered. The high-speed effects are a loss in the main-beam amplitude and a change in sidelobe level. However, in contrast with the case of a linear array, the circular array is relatively free from variations in the beamwidth or generation of spurious frequencies. Specific examples in radar and sonar are discussed.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:31 ,  Issue: 3 )