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Measurement of the microwave structure constant profile

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3 Author(s)
Thompson, M., Jr. ; Institute for Telecommunication Sciences, Boulder, CO, USA ; Marler, F. ; Allen, K.C.

Measurements of the microstructure of refractivity at 9.4 GHz were made in Colorado and Florida up to altitudes of about 29000 ft. The structure function parameterC_{n}^{2}was calculated from these data. Examples of the resulting profiles are presented with corresponding profiles of refractivity and temperature. Values ofC_{n}^{2}varied from about10^{-13}to10^{-17}m-2/3. The heights of occurrence of maximum and minimum values are summarized.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:28 ,  Issue: 2 )

Date of Publication:

Mar 1980

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