Cart (Loading....) | Create Account
Close category search window
 

The resolution limit of a variable baseline synthetic aperture antenna

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
El-Behery, I.N. ; Ontario Hydro, Toronto, Ontario, Canada ; MacPhie, R.H.

The resolution capabilities of a variable baseline correlation interferometer are analyzed using a maximum likelihood estimator algorithm for the output data. Optimum estimates (in the Cramer-Rao sense) for two sources of both equal and unequal strengths, for different levels of receiver-background noise, and for finite integration (averaging) times are obtained. A likelihood probabilityp_{n}(n = 0, 1, 2, 3, ...)is also obtained from the measured data, and the resolution limit is defined to be that for which the probabilitiesp_{1}andp_{2}are equal (on the average). It is shown by a computer simulation that the average resolution limit improves (decreases) with increased integration time, exceeding the traditional Rayleigh limit by an arbitrary amount even for quite unequal source strength ratios and large levels of receiver-background noise.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:28 ,  Issue: 2 )

Date of Publication:

Mar 1980

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.