Cart (Loading....) | Create Account
Close category search window

Criteria for analyzing high frequency testing performance of VLSI automatic test equipment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Burlison, P. ; LTX Corp., San Jose, CA, USA

It is pointed out that the development of higher speed CMOS VLSI, specifically RISC (reduced-instruction-set computer) and CISC (complex-instruction-set computer), places added demands on the high-frequency test capabilities of ATE (automatic test equipment) used to test these components. The author analyzes the attributes of the tester pin electronics and the DUT- (device-under-test-) to-tester interface, and proposes new ATE requirements in these areas. The following issues are discussed: maintaining tester timing accuracy at the DUT pin, testing high-speed CMOS devices with low output impedance, analyzing comparator input capacitance effects, and the importance of a short tester-to-DUT interface. It is concluded that the actual signal frequency capability of the system, which includes improved timing accuracy, as well as specific solutions to the DUT interface limitations, must be addressed and solved

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.