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On the charge sharing problem in CMOS stuck-open fault testing

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2 Author(s)
K. -J. Lee ; Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA ; M. A. Breuer

The charge-sharing problem associated with the detection of CMOS stuck-open faults is analyzed. It is shown that this problem cannot be ignored if high-quality tests are required, and that assuming the worst-case condition and using conventional testing techniques may dramatically reduce the detectability of stuck-open faults. The authors present a layout-driven method to characterize this problem and show that by monitoring of the current supply this problem becomes much easier to solve. Through the use of current supply monitoring a very high improvement factor, which can easily offset the error caused by imprecise estimations of capacitance, has been obtained. It is demonstrated that by slight modification of the layout of a circuit the charge-sharing problem can be eliminated. A robust test generation procedure is also presented

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990