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1 Author(s)
Maly, W. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Summary form only given. It is pointed out that current testing is and will increasingly become attractive as a main technique for testing static CMOS circuits. BIC (built-in current) testing can provide testing qualities achievable with other testing techniques. It is suggested that future testing approaches geared toward high-quality and/or reliability-oriented testing procedures will be formed using a combination of voltage and current testing methodologies

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990