Cart (Loading....) | Create Account
Close category search window
 

Why, IDDQ? [CMOS IC testing]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
McEuen, S. ; Ford Microelectron. Inc., Colorado Springs, CO, USA

Summary form only given. The author discusses the research conducted by Ford Microelectronics on the impact that IDDQ testing will have on the automotive IC industry. This research has been directed toward developing the tools to implement IDDQ testing, to identify failure locations, to understand what IDDQ identifies, to assess vendor quality levels, and to gauge the reliability impact. The increased sensitivity to processing problems that IDDQ testing provides makes it possible to detect infant mortality and early life failures before they become functionally bad. This has been substantiated through lower burn-in failures and life test studies

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.