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Variation of Resistivity with Temperature for Thin Bismuth Films on BeO Substrates

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2 Author(s)
Block, W. ; Univ. of Illinois, IL ; Gaddy, O.

The variation of resistivity with temperature for thin polycrystalline films of bismuth on BeO substrates is reported. Resistivity minima at temperatures of 90-150°C were observed for films of thickness 0.08-1.0 microns. Experimental results are compared with the theory relating the decrease of the mean free path by grain boundary scattering to the decrease in sample size.

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Parts, Hybrids, and Packaging, IEEE Transactions on  (Volume:9 ,  Issue: 2 )