Cart (Loading....) | Create Account
Close category search window

Fundamental Analysis of Cu Brush-Ag Slip Ring Sliding Electrical Contacts

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Garshasb, M. ; Engelhard Industries,Plainville,MA ; Vook, R.

Electrical contacts involving current-carrying copper-wire brushes sliding on a sputter-cleaned silver slip ring and rotating in an ambient of 1 atm of wet CO2were characterized by Auger electron spectroscopy (AES), scanning electron microscopy (SEM), X-ray energy spectroscopy (XES), reflection high-energy electron diffraction (RHEED), and in situ measurements of contact resistance. AES analysis of the slip rings showed 1) carbon formation at the contact zone and 2) increasing amounts of Cu transfer from the brushes to the slip ring with increasing contact current. SEM and XES analyses of the brushes, slip ring, and wear particles showed that the copper content of the wear particles and the copper concentration of the slip ring surface increased with increasing contact current. RHEED studies of the wear particles showed that higher currents resulted in larger grain sizes. Initially, high values of the contact resistance decreased to fractions of a milliohm, and then after approximately 2000 cycles, gradually became more erratic as the contact deteriorated. This deterioration was caused by the accumulation of Ag debris on the Cu brush ends.

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:9 ,  Issue: 1 )

Date of Publication:

Mar 1986

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.