By Topic

High Speed and High Resolution Contact-Type Image Sensor Using an Amorphous Silicon Photodetector Array

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Suzuki, K. ; Toshiba Corp., Kawasaki, Japan ; Saito, T. ; Suda, Y. ; Mori, K.
more authors

A contact-type image sensor has been developed with 16 elements/mm resolution and 0.8 ms/line scanning speed. This surpasses all previously reported devices of this type. These features are achieved by a newly developed highly integrated low noise hybrid circuit technology and a novel photodetector structure. This sensor is very compact with 3456 picture elements in a 216 mm active length. The reason why previous sensors had low speed, how this high performance sensor has been developed, and what remains to be improved is discussed.

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:7 ,  Issue: 4 )