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Can a User Test LSI Microprocessors Effectively?

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1 Author(s)
Luciw, W. ; Sperry Univac,Blue Bell, PA

This paper elucidates user oriented test philosophy for LSI microprocessors. Also, a low-cost incoming inspection tester is described. The significant difference between this and available testers is the use of probabilistic scheme by which the instruction, data, and control signal mixes are generated. This approach reduced significantly tester hardware and supporting software without compromise of overall test performance.

Published in:

Manufacturing Technology, IEEE Transactions on  (Volume:5 ,  Issue: 1 )